Optonor

Vibration measurements
Static deflection measurements
Analysis of MEMS and microscopic structures
High frequency transducer measurements
Nondestructive Testing NDT

With close to 100 systems delivered to customers worldwide, Optonor is established as a leading manufacturer of laser based, interferometric systems for vibration analysis, static deflection measurements and non-destructive testing. Our MEMSMap 510 for analysis of MEMS structures and transducers performs full field measurements up to 240 MHz or higher, while the VibroMap 1000 TV-holography (ESPI) system can analyse structures from sub centimeter to meter in size, in a stable and user friendly way. The SNT 4045 system for non-destructive testing of large and small structures can detect vibrations in the nano range even in workshop environments.

High quality and cost effective solutions based on

Interferometry
Shearography
Holography
Structured illumination

The VibroMap 1000 system is used for Vibration measurements and static deflection mesurements of structures and components ranging in size from sub centimeter to meter. High resolution, non contact measurements with real time display and full field recordings.

The MEMSMap 510 provides three separate measurement functions: High frequency vibration measurements, static deflection measurements and surface profiling. In-plane and out-of plane measurements of structures ranging in size from a few micrometer and up to several millimeter

Laser based NDT. The SNT 4045 provides ultra high sensitivity recordings to detect debonds and structural inhomogenities in small or large structures and components. The non contact and long distance operation provides a powerful tool for fast and efficient non destructive testing